High-performance infrared spectroscopic ellipsometer for thin film and material characterization. Covers 1.7–30 μm range with high sensitivity and no vacuum needed. Ideal for semiconductors, polymers, and coatings.
- JA Woollam IR-VASE
- JA Woollam IR VASE
- JA Woollam IR-VASE Ellipsometer
- JA Woollam IR VASE Ellipsometer

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